The Optronic Laboratories OL-750 was built to LBNL specifications to measure specular transmittance and reflectance versus angle of incidence for specular samples. The sample can be rotated and translated with 5 degrees of freedom and the detector moves in the horizontal plane of the instrument (not necessarily the scattering plane of the sample) to measure reflectance and transmittance. The freedom of movement of the detector also allows the instrument to be used for angle-resolved scattering measurements.


The sample can be rotated to vary the angle of incidence as well as lateral positioning of the sample.

The detector moves in the horizontal plane of the instrument and detects the scattered light in that direction for the given incidence angle of the sample.

Either a silicon or a lead sulfide detector is mounted on the detector arm, giving a choice of wavelength from 350-1100 nm or 1100-2500 nm.


The data collected with this instrument can be used to calculate the bi-directional scattering distribution function (BSDF) for the sample.

Examples of Use

Brushed aluminum venetian blind slats has been characterized using this instrument.

Anisotropic samples cannot be fully characterized due to the limited range of motion of the sample holder.

Below is a close-up on the intricate combination of motors that allow 5 degrees of sample movement.

Attributes and Capabilities:

  • Wavelength range 300-2500 nm
  • Sample holder is limited to samples of size between 2x2” and 3x3”
  • Angle of incidence -20 – 80 degrees
  • Outgoing angle limited by angle of incidence