High-Resolution Electron Microscopy Study of Silica Aerogel Transparent Insulation

TitleHigh-Resolution Electron Microscopy Study of Silica Aerogel Transparent Insulation
Publication TypeConference Paper
Year of Publication1984
AuthorsJerzy H Mazur, Carl M Lampert
Conference Name28th SPIE Annual International Technical Symposium, August 19-24, 1984
Date Published09/1984
Conference LocationSan Diego, CA
Other NumbersEEB-W-84-25, OM-186
Abstract

The structure of silica aerogel was studied by transmission electron microscopy. The aerogel network consists of particles about 10.0 nm in diameter. The chemical composition of these aggregates was found to be a pure stoichiometric SiO2 by both ESCA and Auger spectroscopy. These SiO2 groups appear to form a random network within each particle. The details of this arrangement have yet to be determined, because in this preliminary study, silica aerogel was found to transform after exposure to the intense electron beam.

Notes

Optical Materials Technology for Solar Energy Conversion III

LBNL Report Number

LBL-18245