Ellipsometer

Ellipsometer

JA Woollam VASE ellipsometer on a lab table.
JA Woollam VASE ellipsometer on a lab table.

Ellipsometry is a powerful tool for determining the optical indices and thicknesses of the layers in a thin-film coating especially when combined with radiometric data from our other instruments. This information is used both for analysis of our coating structures and to develop models for optical properties of various solar energy materials.

The JA Woollam VASE ellipsometer is a commercial ellipsometer that measures the change in polarization as light is reflected from the surface of the studied sample. The method is standard for obtaining optical constants (n, k) as well as thickness for thin film coatings on glass.

This ellipsometer can also be used in "scatterometer mode" in which it acts as a spetrophotometer with in-plane bidirectional goniometer function. The ellipsometer shown below by the J.A. Woollam Co. covers the ultraviolet, visible and near infrared range from 250-1700 nm.

Attributes and Capabilities

  • Wavelength range 300-1700 nm
  • Sample size 2x2” to 3x3” is ideal, larger or smaller samples can be accommodated using special procedures.